Semiconductor Metrology

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Semiconductor Metrology
Category: Unknown

Key contact details for Semiconductor Metrology
Phone
6280 9650
Email
Email business
Website
www.technos-intl.com
Address
16 New Industrial Road,, 536204
 

Semiconductor

wafer

Semiconductor Industry


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Business profile

Technos provides x-ray based semiconductor metrology & surface contamination monitoring & measurement systems for manufacture of silicon wafers and IC's

  • Business profile

    Technos provides x-ray based semiconductor metrology & surface contamination monitoring & measurement systems for manufacture of silicon wafers and IC's

Semiconductor Metrology's Keywords

Semiconductor | wafer | Semiconductor Industry | Metrology | X-ray | Contamination | Thin Film | Solar Cell | Photovoltaic | Thin Film Technology | Contamination Monitoring | Xrf | Wafer Handling | X Ray Fluorescence | Thin Film Thickness Measurement | Semiconductor Metrology | X Ray Technology | Semiconductor Wafer Handling | Analytical X-ray | X-ray Measurement Solutions | Thin Film Metrology